A research team from Osaka Metropolitan University proposed using a current-biased kinetic inductance detector with submicron 400 megapixels to image hot spots induced by a localized external stimulus over a 15 × 15 mm2 area. The team utilized a delay-line technique to trace the propagation of internal signals for a pair of signals arising from each hot spot.
Further, they used the timestamps of signal arrivals at the electrodes to determine the position of each hot spot (x, y). Because the signal velocity inside the detector is ultrafast at about 20% the speed of light, a readout circuit with a temporal resolution faster than 250 ps is necessary to resolve the position of a hot spot with a precision of 1.5 μm, which is the size of a meander pitch.
The research is published in the journal AIP Advances.









